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Ion scattering: a spectroscopic tool for study of the outermost atomic layer of a solid surface

H.H. Brongersma - No affiliation found

1972/06/01 Full-length article DOI: 10.1016/0009-2614(72)80138-6 Journal: Chemical Physics Letters

Abstract:

AbstractNoble gas ions which are back-scattered from crystal surface lose a specific amount of energy for surface atoms of a specific mass. The chemical reaction of a silicon (III) crystal surface with bromine has been followed using He+ and Ne+ ion scattering. It is shown that this technique can be used to study the first atomic layer of a surface selectively. Methods using ion scattering to study vibrations of surface atoms are also indicated.