Small angle neutron scattering study of semiconductor microcrystallites in optical glasses
Review articleOpen access

AbstractSmall angle neutron scattering is used to characterize the semiconductor microcrystallites in doped glasses. Results are reported on some silicate glasses that contain cadmium chalcogenide crystallites which act as optical or infrared filters and display interesting non-linear optical properties. The advantages of neutron scattering for the detailed analysis of these materials are described.

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