Magnetic anisotropy factors of vapor deposited CoCr thin films on Si and glass substrates
Review articleOpen access

AbstractSeries of CoxCr1−x thin films have been evaporated under vacuum onto Si (100) and glass substrates. An alternating gradient field magnetometer is used to characterize the static magnetic properties of the samples and Brillouin light scattering is used to study their dynamic magnetic properties. The in-plane easy magnetization axis is found for all samples. Using these results, we computed the first, second and uniaxial magnetic anisotropy factors by several methods. Values of the computed effective magnetic anisotropy factors higher than 106 erg cm−3 have been found. The results are discussed and correlated.

Request full text

References (0)

Cited By (0)

No reference data.
No citation data.
Join Copernicus Academic and get access to over 12 million papers authored by 7+ million academics.
Join for free!