On the effect of local sample slope during modulus measurements by contact-resonance atomic force microscopy
Review articleOpen access
K. Heinze - No affiliation found
2018/11/01 Full-length article DOI: 10.1016/j.ultramic.2018.07.009
Highlights•Local surface slope has a significant effect on Contact Resonant AFM signals.•Measurements on real surfaces are thus subjected to strong misinterpretation.•A method is proposed to get quantitative corrected measurements of the contact modulus.•The correction method can be easily adapted to other nano-mechanical AFM techniques.
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