Short period CdTe(ZnTe) /MnTe superlattices: growth and characterization
Review articleOpen access

AbstractWe report on the growth of CdTe /MnTe and ZnTe /MnTe short-period superlattices. The CdTe and ZnTe layers have been grown by atomic layer epitaxy technique, and a quadrupole mass spectrometer controlled molecular beam epitaxy has been used for the MnTe layers growth. The critical thickness of MnTe on both CdTe and ZnTe layers has been determined by reflected high energy electron diffraction experiments and the structure of the superlattices was studied by X-ray diffraction analysis.

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