Time-of-flight secondary ion mass spectrometry (ToF-SIMS)-based analysis and imaging of polyethylene microplastics formation during sea surf simulation
Review articleOpen access

Highlights•Pre-production microplastic pellets were used to evaluate the methodology•Secondary microplastic < than 10 μm can be detected directly in sea sand•Surface Ions of microplastic particles were used to identify them in sea sand matrix•Chemical images gave size distribution patterns of microplastic particles in matrix•Larger microplastic particles were exposed to a sea surf simulation•Particle number (< 10 μm) increased from 14 to 31 d exposure

Request full text

References (0)

Cited By (0)

No reference data.
No citation data.
Join Copernicus Academic and get access to over 12 million papers authored by 7+ million academics.
Join for free!