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Time-of-flight secondary ion mass spectrometry (ToF-SIMS)-based analysis and imaging of polyethylene microplastics formation during sea surf simulation

H. Jungnickel - No affiliation found

2016/09/01 Full-length article DOI: 10.1016/j.scitotenv.2016.04.025 Journal: Science of The Total Environment

Abstract:

Highlights•Pre-production microplastic pellets were used to evaluate the methodology•Secondary microplastic < than 10 μm can be detected directly in sea sand•Surface Ions of microplastic particles were used to identify them in sea sand matrix•Chemical images gave size distribution patterns of microplastic particles in matrix•Larger microplastic particles were exposed to a sea surf simulation•Particle number (< 10 μm) increased from 14 to 31 d exposure